Resistive memory device and operation method thereof

ABSTRACT

A resistive memory device includes a memory cell array including a unit memory cell coupled between a word line and a bit line, wherein the unit memory cell includes a data storage material and a non-silicon-substrate-based type bidirectional access device coupled in series, a path setting circuit coupled between the bit line and the word line, suitable for providing a program pulse toward the bit line or the word line based on a path control signal, a forward write command, and a reverse write command, and a control unit suitable for providing a write path control signal, a forward program command, and a reverse program command based on an external command signal.

CROSS-REFERENCES TO RELATED APPLICATION

The present application claims priority under 35 U.S.C. §119(a) toKorean application number 10-2013-0046089, filed on Apr. 25, 2013, inthe Korean Intellectual Property Office, which is incorporated herein byreference in its entirety.

BACKGROUND

1. Technical Field

The inventive concept relates to a semiconductor integrated circuit, andmore particularly, to a resistive memory device.

2. Related Art

Resistive memory devices use a resistive material of which a resistanceis sharply changed based on an applied voltage to switch at least twodifferent resistance states. There are typically a phase-change randomaccess memory (PCRAM), a resistive random access memory (ReRAM), and amagnetoresistive random access memory (MRAM) as the resistive memorydevices.

Among the resistive memory devices, the PCRAM determines data to bestored in the selected memory cell based on a crystalline state of aphase-change material. By heating the phase-change material, a phase ofthe phase-change material may be changed, and thus the resistance statemay be controlled. The PCRAM has advantages of stability, unnecessity ofan erase operation, endurance, support of access in byte units inaddition to non-volatility and support of high-speed operation.

Recently, to obtain high capacity and high integration, the PCRAM isrequired to support a multi-level cell structure.

FIGS. 1A and 1B are cross-sectional views for explaining characteristicsof a conventional PCRAM.

As illustrated in FIG. 1A, the conventional PCRAM includes asemiconductor substrate 1 in which a bottom structure including anaccess device (not shown) and a heating electrode (not shown) is formed,a phase-change material layer 5 formed to be in contact with the heatingelectrode within the semiconductor substrate 1, and an upper electrode 7formed on the phase-change material 5. The phase-change material 5 isinsulated from the adjacent phase-change material by an insulating layer3.

The phase-change material 5 may be formed using a chalcogenide material,for example, germanium-antimony-tellurium (hereinafter, referred to asGST or Ge—Sb—Te). However, the GST material causes a phase-separationdue to repeated crystallization and amorphization.

Therefore, as illustrated in FIG. 1B, as the number of use of the PCRAMis increased, antimony (Sb) within the GST material migrates toward aside of the heating electrode, and tellurium (Te) within the GSTmaterial migrates toward a side of the upper electrode 7.

FIGS. 2A and 2B are distribution diagrams for explaining thephase-separation of the GST material.

FIG. 2A shows the distribution of elements constituting a GST materialin an initial state, and FIG. 2B shows the distribution of elementconstituting the GST material after the certain number of repeated writeoperations, for example, program operations, are performed.

As seen from FIG. 2A, tellurium (Te) and antimony (Sb) are uniformlydistributed in a side of an anode, for example, an upper electrode and aside of a cathode, for example, a heating electrode. However, asoperation cycles are repeated, tellurium (Te) migrates toward the anodeand is concentrated in the anode side, whereas antimony (Sb) migratestoward the cathode and is concentrated in the cathode side.

Such phase-separation is caused when the elements constituting the GSTmaterial are pulled by an electric field. A resistance of thephase-change material in an amorphous state becomes low.

FIGS. 3A and 3B are characteristic diagrams illustrating current andvoltage characteristic changes of a PCRAM due to the repeated writeoperations.

FIG. 3A illustrates a change of a resistance-current characteristic ofthe PCRAM due to the repeated write operations. When comparing aresistance-current characteristic curve A11 in an initial operation anda resistance-current characteristic curve B11 after the phase-separationis caused by repeated operation cycles, it may be seen that a resistanceof a phase-change material, for example, a GST material, after thephase-separation is reduced. Reduction in the resistance of thephase-change material means increase in a reset current and thus anoperation voltage of the PCRAM is increased.

FIG. 3B illustrates a change of a current-voltage characteristic of aPCRAM due to the repeated write operations. When comparing acurrent-voltage characteristic curve A12 in an initial operation and acurrent-voltage characteristic B12 after the phase-separation, it may beseen that a voltage is totally dropped when the same driving current isapplied. That is, it may be seen that a threshold voltage is loweredafter the phase-separation of a phase-change material, for example, aGST material, and thus malfunction of the PCRAM may be caused.

FIGS. 4A and 4B are characteristic diagrams illustrating reliabilitychange of a PCRAM due to repeated write operations.

First, FIG. 4A illustrates endurance change of a PCRAM due to therepeated write operations. It may be seen that as the number of writeoperations is increased, a resistance of a phase-change material, forexample, a GST material, is lowered from A13 to B13, and thus enduranceis degraded.

FIG. 4B illustrates a change of a retention characteristic of a PCRAMdue to the repeated write operations of the PCRAM. When comparing theretention characteristic curve A14 in an initial operation and theretention characteristic curve B14 after the phase-separation, it may beseen that the data retention characteristic is remarkably degraded.

As described above, the reliability of PCRAM is degraded and thelifespan of PCRAM is limited due to the phase-separation of thephase-change material, for example, a GST material, caused by therepeated operations.

To alleviate these concerns, refresh operation of the PCRAM may beconsidered. However, when the refresh operation, including, for example,an erase operation, is performed in a separate operation period, a timefor the refresh operation may be additionally needed, and thus writelatency may be increased.

SUMMARY

According to one aspect of an exemplary embodiment, a resistive memorydevice may include a data storage material coupled to a firstinterconnection, and a non-silicon-substrate-based type bidirectionalaccess device coupled between the data storage material and a secondinterconnection.

According to one aspect of an exemplary embodiment, a memory device mayinclude a memory cell array including a unit memory cell coupled betweena word line and a bit line, wherein the unit memory cell includes a datastorage material and a non-silicon-substrate-based type bidirectionalaccess device coupled in series, a path setting circuit coupled betweenthe bit line and the word line, suitable for providing a program pulsetoward the bit line or the word line based on a path control signal, aforward write command, and a reverse write command, and a control unitsuitable for providing a write path control signal, a forward programcommand, and a reverse program command based on an external commandsignal.

According to another aspect of an exemplary embodiment, a dataprocessing system may include a resistive memory device including amemory cell array, a control unit suitable for controlling an operationof the memory cell array, and a path setting circuit suitable forproviding a program pulse to the memory cell array, and a memorycontroller suitable for accessing the resistive memory device inresponse to request of a host. The memory cell array may include a unitmemory cell connected between a word line and a bit line, and includinga data storage material and a non-silicon-substrate-based typebidirectional access device. The write control circuit may be connectedbetween the bit line and the word line, and is suitable for providingthe program pulse to the bit line or the word line in response to a pathcontrol signal, a forward program command, and a reverse program commandprovided from the control unit.

According to another aspect of an exemplary embodiment, a dataprocessing system may include a processor, an operation memory suitablefor storing an application, data, and a control signal required for anoperation of the processor, a resistive memory device which includes amemory cell array with a plurality of unit memory cells accessed by theprocessor and connected between bit lines and word lines, a control unitsuitable for controlling an operation of the memory cell array, and apath setting circuit suitable for providing a program pulse to thememory cell array, and a user interface suitable for performing inputand output between the processor and a user. The memory cell array mayinclude a unit memory cell connected between a word line and a bit line,and including a data storage material and a non-silicon-substrate-basedtype bidirectional access device. The path setting circuit is connectedbetween the bit line and the word line, and suitable for providing theprogram pulse to the bit line or the word line in response to a pathcontrol signal, a forward write command, and a reverse program commandprovided from the control unit.

According to another aspect of an exemplary embodiment, an operationmethod of a resistive memory device including a unit memory cell, whichincludes a data storage material coupled to a first interconnection, anon-silicon-substrate-based type bidirectional access device coupledbetween the data storage material and a second interconnection, and apath setting circuit suitable for providing a program pulse to the unitmemory cell. The operation method may include applying the program pulseto a side of the first interconnection from the path setting circuit inat least portion of cycles of a program operation in response to aprogram command, and applying the program pulse to a side of the secondinterconnection from the path setting circuit in the remaining cycles ofthe program operation in response to the program command.

According to another aspect of an exemplary embodiment, an operationmethod of a resistive memory device with a unit memory cell, theoperation method includes providing a forward program current path forthe unit memory cell by applying a program pulse in a forward direction,and providing a reverse program current path for the unit memory cell byapplying the program pulse in a reverse direction, wherein the unitmemory cell includes a data storage material and anon-silicon-substrate-based type bidirectional access device coupled inseries between a first interconnection and a second interconnection.

According to another aspect of an exemplary embodiment, a resistivememory device includes a memory cell array with a plurality of unitmemory cells coupled between column lines and row lines, and a pathsetting circuit suitable for selecting a unit memory cell to beprogrammed, and providing a forward program current path or a reverseprogram current path for the selected unit memory cell, via thecorresponding column line and the corresponding row line.

These and other features, aspects, and embodiments are described belowin the section entitled “DETAILED DESCRIPTION”.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other aspects, features and other advantages of thesubject matter of the present disclosure will be more clearly understoodfrom the following detailed description taken in conjunction with theaccompanying drawings, in which:

FIGS. 1A and 1B are cross-sectional views for explaining characteristicsof a conventional PCRAM;

FIGS. 2A and 2B are distribution diagrams for explainingphase-separation of a GST material;

FIGS. 3A and 3B are characteristic diagrams illustrating current andvoltage characteristics changes of a PCRAM due to repeated writeoperations;

FIGS. 4A and 4B are characteristic diagrams illustrating reliabilitychange of a PCRAM due to repeated write operations;

FIG. 5 is a diagram illustrating a unit memory cell of a resistivememory device according to an exemplary embodiment of the inventiveconcept;

FIG. 6 is a block diagram illustrating a path setting circuit of aresistive memory device according to an exemplary embodiment of theinventive concept;

FIG. 7 is an a detailed diagram illustrating the path setting circuitshown in FIG. 6;

FIG. 8 is a block diagram illustrating a path control signal generationunit;

FIGS. 9 and 10 are graphs illustrating a program and verify (PNV) pulseapplied to an exemplary embodiment of the inventive concept;

FIGS. 11A, 11B, 12A, 12B, 13A, and 13B are illustrative views forexplaining an operation method of a resistive memory device according toan exemplary embodiment of the inventive concept;

FIGS. 14A and 14B are illustrative views illustrating the PNV concept ofa resistive memory device;

FIG. 15 is a block diagram illustrating a resistive memory deviceaccording to an exemplary embodiment of the inventive concept;

FIG. 16 is a block diagram illustrating a data processing systemaccording to an exemplary embodiment of the inventive concept; and

FIG. 17 is a block diagram illustrating a data processing deviceaccording to another exemplary embodiment of the inventive concept.

DETAILED DESCRIPTION

Hereinafter, exemplary embodiments will be described in greater detailwith reference to the accompanying drawings.

Exemplary embodiments are described herein with reference tocross-sectional illustrations that are schematic Illustrations ofexemplary embodiments (and intermediate structures). As such, variationsfrom the shapes of the illustrations as a result, for example, ofmanufacturing techniques and/or tolerances, are to be expected. Thus,exemplary embodiments should not be construed as limited to theparticular shapes of regions illustrated herein but may be to includedeviations in shapes that result, for example, from manufacturing. Inthe drawings, lengths and sizes of layers and regions may be exaggeratedfor clarity. Like reference numerals in the drawings denote likeelements. It should be readily understood that the meaning of “on” and“over” in the present disclosure should be interpreted in the broadestmanner such that “on” means not only “directly on” but also “on”something with an intermediate feature(s) or a layer(s) therebetween,and that “over” means not only directly on top but also on top ofsomething with an intermediate feature(s) or a layer(s) therebetween. Itis also noted that in this specification, “connected/coupled” refers toone component not only directly coupling another component but alsoindirectly coupling another component through an intermediate component.In addition, a singular form may include a plural form as long as it isnot specifically mentioned in a sentence.

FIG. 5 is a diagram illustrating a unit memory cell of a resistivememory device according to an exemplary embodiment of the inventiveconcept.

As illustrated in FIG. 5, the unit memory cell 10 of a resistive memorydevice according to an exemplary embodiment of the inventive concept mayinclude a data storage material 12 and a bidirectional access device 14connected in series.

More specifically, one terminal of the data storage material 12 isconnected to a first interconnection 16, for example, a bit line BL or aconductive line electrically connected to the bit line BL. Further, oneterminal of the bidirectional access device 14 connected to the datastorage material 12 in series is connected to a second interconnection18, for example, a word line WL or a conductive line electricallyconnected to the word line WL.

That is, the bidirectional access device 14 applied to the inventiveconcept may be a device of which terminals configured to input andoutput current are connected to the word line and the bit line throughinterconnections, and thus may be referred to as aninterconnection-connection type bidirectional access device or anon-silicon-substrate-based type bidirectional access device. Theinterconnection-connection type bidirectional access device may be, forexample, a transistor, a mixed ionic-electronic conductor (MIEC) device,an ovonic threshold switching (OTS) device, a zener diode, or the like,but the interconnection-connection type bidirectional access device isnot limited thereto.

One terminal of the silicon (Si) substrate-based bidirectional accessdevice is in contact with the Si substrate, for example, for providing awell bias or a ground terminal. Therefore, when a reverse bias isapplied to the Si substrate-based bidirectional access device, data maynot be programmed in the data storage material 12 by an alternatingcurrent (AC) bias. This is because the capacitance of the Si substrateitself is large. Therefore, the bidirectional access device may notapply enough energy for changing a polarity applied to the data storagematerial 12.

On the other hand, in the bidirectional access device 14, of whichterminals are connected to interconnections, by applying an AC bias,current may flow in a forward direction or a reverse direction, anddirection change of current flow leads to change of the polarity appliedto the data storage material 12.

That is, the resistive memory device may control a direction of currentflowing in the unit memory cell 10 through the bidirectional accessdevice 14. Therefore, a forward current path Ipnv(F) from the bit lineBL to the word line WL via the first interconnection 16, the datastorage material 12, the access device 14, and the secondinterconnection 18, and a reverse current path Ipnv(R) from the wordline WL to the bit line BL via the second interconnection 18, the accessdevice 14, the data storage material 12, and the first Interconnection16 may be formed.

When the forward current path is formed, the terminal of the datastorage material 12 in a side of the bit line BL may serve as an anode,and the terminal thereof connected to the bidirectional access device 14may serve as a cathode. When the reverse current path is formed, theterminal of the data storage material 12 in the side of the bit line BLmay serve as the cathode, and the terminal thereof connected to thebidirectional access device 14 may serve as the anode.

Further, since the terminals of the bidirectional access device 14 areconnected to the word line and the bit line through theinterconnections, the current path may be changed by a program pulse (ACbias) provided in a program and verify (PNV) operation.

Therefore, the resistive memory device with the unit memory cell 10illustrated in FIG. 5 may perform the forward PNV operation through theforward current path and the reverse PNV operation through the reversecurrent path. Accordingly, since the polarity applied to the datastorage material 12 is changed according to the current path, thedistribution of elements included in the data storage material 12 may berefreshed.

Here, the data storage material 12 may include a phase-change material,for example, a GST material. Among elements constituting the GSTmaterial, tellurium (Te) has a property to move toward the anode, andantimony (Sb) has a property to move toward the cathode. In theexemplary embodiment of the inventive concept, when the PNV operation isperformed by appropriately utilizing both the forward current path andthe reverse current path (hereinafter, referred to as “mixing” or“mix”), phase-separation of tellurium (Te) and antimony (Sb) may beeffectively prevented.

To obtain the effect, controlling the current path in the PNV operationis needed.

FIG. 6 is a block diagram illustrating a path setting circuit of aresistive memory device according to an exemplary embodiment of theinventive concept.

As illustrated in FIG. 6, a path setting circuit 100 may include a firstpath setting unit 110 and a second path setting unit 120.

The first path setting unit 110 may couple a bit line BL within thememory cell array 130 with a terminal for supplying a program pulsePGM_pulse or a terminal for supplying a ground voltage, in response to apath control signal C_PNV and a forward program command PNVF.

The second path setting unit 120 may couple a word line WL within thememory cell array 130 with the terminal for supplying the program pulsePGM_pulse or the terminal for supplying the ground voltage based on thepath control signal C_PNV and a reverse program command PNVR.

The path control signal C_PNV, the forward program command PNVF, and thereverse program command PNVR may be provided from a control unit (see360 of FIG. 15). The path control signal C_PNV may be generated based onan external program command, and the forward program command PNVF andthe reverse program command PNVR may be complementary signals generatedbased on the number of programming upon the unit memory cell within thememory cell array 130.

The memory cell array 130 includes a plurality of unit memory cellscoupled between a plurality of word lines WL0 to WLm and a plurality ofbit lines BL0 to BLn, and each of the unit memory cells may include thedata storage material and the bidirectional access device connected inseries as illustrated in FIG. 5.

FIG. 7 is a detailed diagram Illustrating the path setting circuit shownin FIG. 6.

Referring to FIG. 7, the first path setting unit 110 may include a firstswitch, for example, NMOS transistor, 112 configured to receive the pathcontrol signal C_PNV and be driven based on the forward program commandPNVF, and a first driver 114 connected between the terminal forsupplying the ground voltage and the terminal for supplying the programpulse PGM_pulse, and configured to drive the bit line BL with the groundvoltage or the program pulse PGM_pulse based on an output signal of thefirst switch 112. Here, the first driver 114 may be realized by using aNMOS transistor and a PMOS transistor.

The second path setting unit 120 may include a second switch, forexample, NMOS transistor, 122 configured to receive the path controlsignal C_PNV and be driven in response to the reverse program commandPNVR, and a second driver 124 connected between the terminal forsupplying the ground voltage and the terminal for supplying the programpulse PGM_pulse, and configured to drive the word line WL with theground voltage or the program pulse PGM_pulse based on an output signalof the second switch 122. Here, the first driver 124 may be realized byusing an NMOS transistor and a PMOS transistor.

In FIG. 7, the first driver 114 and the second driver 124 may be devicesconfigured to output an AC type program pulse to the output terminalsthereof.

The unit memory cell 10 is connected between the bit line BL and theword line WL, and may include the data storage material 12 and thebidirectional access device 14.

As described above, the forward program command PNVF and the reverseprogram command PNVR may be complementary signals generated based on thenumber of programming upon the unit memory cell 10.

FIG. 8 is a block diagram illustrating a path control signal generationunit.

Referring to FIG. 8, the path control signal generation unit 200generates a forward program command PNVF and a reverse program commandPNVR based on a program number count signal NoPNV.

The PNV operation by the forward current path Ipnv(F) set by the forwardprogram command PNVF and the reverse PNV operation by the reversecurrent Ipnv(R) set by the reverse program command PNVR may be usedthrough appropriate mixing thereof in an operation of the memory device.

The program sequence of the reverse program mixed with the forwardprogram operation may be previously set by a memory controller (or amemory device manufacturer or a user).

In an exemplary embodiment, the path control signal generation unit 200may output the forward program command PNVF and the reverse programcommand PNVR as the complementary signals when the number of programmingdenoted by the programming number counter signal NoPNV is a multiple ofthe predetermined number of times. In another exemplary embodiment, thepath control signal generation unit 200 may output the forward programcommand PNVF and the reverse program command PNVR as the complementarysignals when the number of programming denoted by the program numbercounter signal NoPNV matches at least one of predetermined references.

Therefore, the path setting circuit 100 drives (or transfers) theprogram pulse PGM_pulse to the bit line BL when the path control signalC_PNV is activated, for example, to a logic high level, the forwardprogram command PNVF is activated, for example, to a logic high level,and the reverse program command PNVR is deactivated, for example, to alogic low level. Therefore, a write path via the data storage material12 and the bidirectional access device 14 may be formed and datacorresponding to the program pulse PGM_pulse may be stored in the datastorage material 12.

On the other hand, the path setting circuit 100 drives (or transfers)the program pulse PGM_pulse to the word line WL when the path controlsignal C_PNV is activated, for example, to a logic high level, theforward program command PNVF is inactivated, for example, to a logic lowlevel, and the reverse program command PNVR is activated, for example,to a logic high level. Therefore, a write path via the bidirectionalaccess device 14 and the data storage material 12 may be formed and datacorresponding to the program pulse PGM_pulse may be stored in the datastorage material 12.

FIGS. 9 and 10 are graphs illustrating a PNV pulse applied to theexemplary embodiment of the inventive concept.

As described above, the embodiment of the inventive concept may performprogramming on the data storage material in the forward direction or thereverse direction, by introducing the interconnection-connection typebidirectional access device. That is, an Ac bias may be supplied througha current path formed from a bit line toward a word line, and the ACbias may be supplied through a current path formed from the word linetoward the bit line.

Here, the program pulse PGM_pulse may be supplied in the same shape inthe forward direction and in the reverse direction.

That is, as illustrated in FIG. 9(a), a large amount of current may beapplied to perform a forward directional programming to a reset statefor a short time, and a current having a slow quench waveform may beapplied to perform the forward directional programming to a set state.Accordingly, the pulse having the same shape as in the forwarddirectional programming may be applied in a reverse directionalprogramming to a reset state as illustrated in FIG. 10(a).

FIG. 9(b) illustrates a program pulse of a rectangular waveform appliedto perform a forward directional programming to the set state, and theprogram pulse having the same shape as illustrated in FIG. 10(b) may beapplied in the reverse directional programming to the set state.

FIGS. 11A, 11B, 12A, 12B, 13A, and 13B are Illustrative views forexplaining an operation method of a resistive memory device according toan exemplary embodiment of the inventive concept.

FIGS. 11A and 11B illustrate a case in which a forward directionalprogramming and a reverse directional programming are performed in oneprogram operation (or in one program cycle). Since all the forwarddirectional programming and the reverse directional programming areperformed in one program operation, phase-separation of a phase storagematerial may be fundamentally prevented.

FIGS. 12A and 12B illustrate a case in which PNV is performed byalternately forming a forward current path Ipnv(F) and a reverse currentpath Ipnv(R) so that a resistance state of the data storage materialmatches a target resistance level.

In a first PNV cycle, a forward current path is formed and a programpulse is provided from a bit line side to a word line side, and a secondPNV cycle, a reverse current path is formed and the program pulse isprovided from the word line side to the bit line side.

By performing both the forward directional programming and the reversedirectional programming, the phase-separation of elements constituting adata storage material may be suppressed, and reliability and lifespan ofthe resistive memory device may be improved.

FIGS. 13A and 13B illustrate in a case in which at least one reversedirectional programming is performed while forward directionalprogramming is performed predetermined times among the PNV cycles.

By performing the forward directional programming several times, thephase-separation of the elements constituting a data storage materialmay be caused. However, in the exemplary embodiment, before the degreeof phase-separation affects reliability of the memory device, at leastone reverse directional programming is performed so that an elementdistribution state of a data storage material is refreshed.

FIGS. 14A and 14B are illustrative views illustrating the PNV concept ofa resistive memory device.

In the related art, as illustrated in FIG. 14A, since PNV is performedonly through a current path formed to one direction, that is, from thebit line side to the word line side, the phase-separation of a datastorage material is necessarily caused as the number of operations isincreased.

On the other hand, in the embodiment of inventive concept, asillustrated in FIG. 14B, a current path may be changed in the performingof the PNV, for example, the forward directional programming isperformed in the current incremental type PNV operation, whereas thereverse directional programming is performed in a current decrementaltype PNV operation.

Therefore, since the element distribution state is refreshed before thephase-separation of elements constituting a data storage material isformed, operation reliability of the memory device may be improved andlifespan of the memory device may be increased.

FIG. 15 is a block diagram Illustrating a resistive memory device 300according to an exemplary embodiment of the inventive concept.

Referring to FIG. 15, the resistive memory device 300 may include amemory cell array 310, a write control circuit 330, a read controlcircuit 340, an input/output buffer 350, a control unit 360, and a pathsetting circuit 370.

Each of a plurality of unit memory cells included in the memory cellarray 130 may include the memory cell 10 illustrated in FIG. 5. Further,each of the unit memory cells within the memory cell array 310 areconnected to a respective word line WL and a respective bit line BL.

The control unit 360 receives an external command signal CTRL and anexternal address ADD, including a row address and a column address,decodes the row address and the column address, and generates a pathcontrol signal C_PNV, a forward program command PNVF, and a reverseprogram command PNVR, in which the address information for the unitmemory cell to be accessed within the memory cell array 310 may beincorporated. The write control circuit 330 receives data DATA from theinput/output buffer 350, and provides the data DATA to the path settingcircuit 370 under control of the control unit 360.

The path setting circuit 370 is connected between the bit line and theword line. The path setting circuit 370 receives a program pulsePGM_pulse provided from the write control circuit 330, and performs aprogram operation by providing a forward current path and a reversecurrent path via the selected bit line and the selected word line basedon a path control signal C_PNV, a forward program command PNVF, and areverse program command PNVR provided from the control unit 360. Asdescribed above, the program pulse may be provided in an AC type in theforward/reverse directional programming.

The read control circuit 340 provides the data read from the selectedunit memory cell within the memory cell array 310 to the input/outputbuffer 350 under control of the control unit 360.

In the resistive memory device 300, since a polarity applied to a datastorage material constituting a unit memory cell is changed according toa predetermined criterion, a distribution state of elements constitutinga data storage material may be refreshed. Therefore, high reliability ofthe memory device 300 may be ensured and lifespan of the resistivememory device may be increased.

In the exemplary embodiment of the inventive concept, the write controlcircuit 330 and the path setting circuit 370 may be composed to writecontrol unit 30.

FIG. 16 is a block diagram illustrating a data processing system 400according to an exemplary embodiment of the inventive concept.

The data processing system 400 may include a memory controller 420connected between a host and a resistive memory device 410.

The memory controller 420 may access the resistive memory device 410 inresponse to request of the host, and therefore the memory controller 420may include a processor 4201, an operation memory 4203, a host interface4205, and a memory interface 4207.

The processor 4201 may control an overall operation of the memorycontroller 420, and the operation memory 4203 may store an application,data, a control signal, and the like required for operation of thememory controller 420.

The host interface 4205 may perform protocol conversion for data/controlsignal exchange between the host and the memory controller 420, and thememory interface 4207 may perform protocol conversion for data/controlsignal exchange between the memory controller 420 and the resistivememory device 410.

The resistive memory device 410 may include a memory cell arrayincluding a data storage material and an interconnection-connection typebidirectional access device connected thereto in series as a unit memorycell, for example, as shown in FIG. 5, and a path setting circuitconfigured to form a current path to a forward direction or a reversedirection in an PNV operation of the memory cell array. In particular,the interconnection-connection type bidirectional access device hasterminals, through which current is input and output, connected to a bitline and a word line through interconnections, and thus is configured tosupply an AC bias to the data storage material. Therefore, the pathsetting circuit may apply the AC type program pulse to the unit memorycell to the forward direction or the reverse direction according to theset current path to perform a PNV operation.

In the exemplary embodiment of the inventive concept, the dataprocessing system Illustrated in FIG. 16 may be a memory card, but it isnot limited thereto.

FIG. 17 is a block diagram illustrating a data processing system 500according to another exemplary embodiment of the inventive concept.

The data processing system 500 may include a resistive memory device510, a processor 520, an operation memory 530, and a user interface 540,and if necessary, the data processing system 500 may further include acommunication module 550.

The processor 520 may be a central processing unit (CPU), and theoperation memory 530 stores an application program, data, a controlsignal, and the like required for an operation of the data processingsystem 500. The user interface 540 may provide an environment in which auser accesses to the data processing system 500, and provides a dataprocessing process, a result, and the like of the data processing system500 to the user.

The resistive memory device 510 may include a memory cell arrayincluding a data storage material and an interconnection-connection typebidirectional access device connected thereto in series as a unit memorycell, for example, as shown in FIG. 5, and a path setting circuitconfigured to form a current path to a forward direction or to a reversedirection in a PNV operation of the memory cell array. In particular,the interconnection-connection type bidirectional access device hasterminals, through which current is input and output, connected to a bitline and a word line through interconnections, and thus is configured tosupply an AC bias to the data storage material. Therefore, the pathsetting circuit may apply the AC type program pulse to the unit memorycell to a forward direction or the reverse direction according to theset current path to perform a PNV operation.

The data processing systems illustrated in FIGS. 16 and 17 may be usedas a disc apparatus, an internal/external memory card of a portableelectronic apparatus, an image processor, or application chipsets.

The above embodiment of the present invention is illustrative and notlimitative. Various alternatives and equivalents are possible. Theinvention is not limited by the embodiment described herein. Nor is theinvention limited to any specific type of semiconductor device. Otheradditions, subtractions, or modifications are obvious in view of thepresent disclosure and are intended to fall within the scope of theappended claims.

What is claimed is:
 1. A resistive memory device, comprising: a memorycell array including a unit memory cell coupled between a word line anda bit line, wherein the unit memory cell includes a data storagematerial and a non-silicon-substrate-based type bidirectional accessdevice coupled in series; a path setting circuit coupled between the bitline and the word line, suitable for providing a program pulse towardthe bit line or the word line based on a path control signal, a forwardwrite command, and a reverse write command; and a control unit suitablefor providing a write path control signal, a forward program command,and a reverse program command based on an external command signal. 2.The resistive memory device of claim 1, wherein the unit memory cellincludes a data storage material coupled to a first interconnection, anon-silicon-substrate-based type bidirectional access device having oneterminal connected to the data storage material, and a secondinterconnection connected to the other terminal of thenon-silicon-substrate-based type bidirectional access device.
 3. Theresistive memory device of claim 1, wherein the path setting circuitincludes: a first path setting unit connected between the bit line and aterminal for supplying the program pulse, and suitable for transferringthe program pulse to the side of the bit line based on the path controlsignal and the forward write command; and a second path setting unitconnected between the word line and the terminal for supplying theprogram pulse, and suitable for transferring the program pulse to theside of the word line based on the path control signal and the reversewrite command.
 4. The resistive memory device of claim 1, wherein theforward program command and the reverse program command arecomplementary signals generated based on the number of programming. 5.The resistive memory device of claim 1, wherein the first path settingunit includes: a first switch suitable for receiving the path controlsignal, and being driven based on the forward write command; and a firstdriver coupled between a terminal for supplying a ground voltage and aterminal for supplying the program pulse, and suitable for driving thebit line with the ground voltage or the program pulse based on an outputsignal of the first switch.
 6. The resistive memory device of claim 1,wherein the second path setting unit includes: a second switch suitablefor receiving the path control signal, and being driven based on thereverse write command; and a second driver coupled between the terminalfor supplying the ground voltage and the terminal for supplying theprogram pulse, and suitable for driving the word line WL with the groundvoltage or the program pulse PGM_pulse based on an output signal of thesecond switch.
 7. A data processing system, comprising: a resistivememory device including a memory cell array, a control unit suitable forcontrolling an operation of the memory cell array, and a path settingcircuit suitable for providing a program pulse to the memory cell array;and a memory controller suitable for accessing the resistive memorydevice in response to request of a host, wherein the memory cell arrayincludes a unit memory cell connected between a word line and a bitline, and including a data storage material and anon-silicon-substrate-based type bidirectional access device, andwherein the path setting circuit is coupled between the bit line and theword line, and is suitable for providing the program pulse to the bitline or the word line based on a path control signal, a forward writecommand, and a reverse program command provided from the control unit.8. A data processing system, comprising: a processor; an operationmemory suitable for storing an application, data, and a control signalrequired for an operation of the processor; a resistive memory devicewhich includes a memory cell array with a plurality of unit memory cellsaccessed by the processor and connected between bit lines and wordlines, a control unit suitable for controlling an operation of thememory cell array, and a path setting circuit suitable for providing aprogram pulse to the memory cell array; and an user interface suitablefor performing data input and output between the processor and a user,wherein the memory cell array includes a unit memory cell connectedbetween a word line and a bit line, and including a data storagematerial and a non-silicon-substrate-based type bidirectional accessdevice, wherein the path setting circuit is connected between the bitline and the word line, and suitable for providing the program pulse tothe bit line or the word line based on a path control signal, a forwardwrite command, and a reverse program command provided from the controlunit.
 9. An operation method of a resistive memory device with a unitmemory cell, the operation method comprising: providing a forwardprogram current path for the unit memory cell by applying a programpulse in a forward direction based on a path control signal; andproviding a reverse program current path for the unit memory cell byapplying the program pulse in a reverse direction based on the pathcontrol signal, wherein the unit memory cell includes a data storagematerial and a non-silicon-substrate-based type bidirectional accessdevice coupled in series between a first interconnection and a secondinterconnection.
 10. A resistive memory device, comprising: a memorycell array with a plurality of unit memory cells coupled between columnlines and row lines; and a path setting circuit suitable for selecting aunit memory cell to be programmed, and for providing a forward programcurrent path or a reverse program current path for the selected unitmemory cell, via the corresponding column line and the corresponding rowline, wherein the path setting circuit includes: a first path settingunit suitable for driving the corresponding column line with a programpulse or a ground voltage based on a path control signal; and a secondpath setting unit suitable for driving the corresponding row line withthe ground voltage or the program pulse based on the path controlsignal.
 11. The resistive memory device of claim 10, wherein each of theunit memory cells includes: a phase-change material coupled to therespective column line; and a non-silicon-substrate-based typebidirectional access device coupled between the phase-change materialand the respective row line.
 12. The resistive memory device of claim11, wherein the phase-change material includes agermanium-antimony-tellurium (GST).
 13. The resistive memory device ofclaim 11, wherein the bidirectional access device includes one selectedfrom the group including a transistor, a mixed ionic-electronicconductor (MIEC) device, an ovonic threshold switching (OTS) device, anda zener diode.